Rothe, Hendrik

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- (PETERSEN, R., ROTHE, H., HÜSER, D.) Large area AFM-scans with the Nanometer Coordinate Measuring Machine. - In: WIKENING, G. (Hrsg.): Proceedings of the 5th Seminar on Quantitative Microscopy (QM) and 1th Seminar on Nanoscale Calibration Standards and Methods: Dimensional measurements in the micro- and nanometre range, PTB-Report. Bergisch Gladbach.
- (SCHAEL, U., ROTHE, H.) Field measurements with 1574nm imaging, scannerless, eye-safe laser radar. - In: KAMERMAN, G. W. (Hrsg.): Laser Radar Technology and Applications VI, Proc. SPIE 4377.
- (SCHAEL, U., ROTHE, H.) Influence of target surfaces and speckles for eye-safe, scannerless, imaging laser radar. - In: GU, Z. H., MARADUDIN, A. A. (Hrsg.): Surface Scattering and Diffraction for Advanced Metrology III, Proc. SPIE 4447.
- (RINDER, T., ROTHE, H.) Metrological characterization of an ARS sensor based on an elliptical mirror system and a calibrated CMOS photo detector array. - In: GU, Z. H., MARADUDIN, A. A. (Hrsg.): Surface Scattering and Diffraction for Advanced Metrology III, Proc. SPIE 4447.
- (RINDER, T., ROTHE, H.) Measuring the scatter distribution of PSL spheres on Si wafers using a fast calibrated CMOS photo detector array. - In: DUPARRE, A., SINGH, B. (Hrsg.): Optical Metrology Roadmap for the Semiconductor, Optical and Data Storage Industries II, Proc. SPIE 4449.
- (MÜLLER, A., ROTHE, H.) Optimization of control parameters of a coordinate measureing machine. - 6. US National Congress on Computational Mechanics, (USNCCM) Dearborn, Detroit.

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- Optik und Optronik in der Wehrtechnik I. Studiengesellschaft der Deutschen Gesellschaft für Wehrtechnik GmbH: Bonn. ISBN: 3-965938-00-4.