Rothe, Hendrik
B
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dynamic behaviour of a Nanometer Coordinante Measuring Machine
(PTB-Bericht No PTB-F-39). - In: HASCHE, K., MIRANDE, W., WILKENING,
G. (Hrsg.): Proceedings of the 4th Seminar on Quantitative Microscopy:
Dimensional measurements in the micro- and nanometre range - applications
- challenges - state of the art, Semmering, Jan. 2000.
- (HÜSER, D., ROTHE, H., PETERSEN, R.) Recognizing Objects
in Dimensional Micro-Metrology (PTB-Bericht No PTB-F-39). - In:
HASCHE, K., MIRANDE, W., WILKENING, G. (Hrsg.): Proceedings of
the 4th Seminar on Quantitative Microscopy: Dimensional measurements
in the micro- and nanometre range - applications - challenges
- state of the art, Semmering, Jan. 2000.
- (RINDER, T., ROTHE, H.) Angle resolved light scatter measurements
for the surface parameter identification. - Proceedings of the
X. International Colloquium on Surfaces, Chemnitz, Feb. 2000,
S. 310-321. ISBN-No. 3-8265-6999-7.
- (RINDER, T., ROTHE, H.) Surface identification using angle resolved
light scatter measurements. - IEEE-INNS-ENNS International Joint
Conference on Neural Networks, Como, July 2000, Chapter 5.7: Manufacturing.
- (RINDER, T., ROTHE, H.) Design problems of calibrated BRDF sensors:
dynamic range, speed, angle of view (Art.-No. 4100-18). - In:
GU, Z.-H., MARADUDIN, A. A. (Hrsg.): Proc. SPIE, Scattering and
Surface Roughness III, San Diego, Aug. 2000.
- (HÜSER, D., ROTHE, H.) AFM data analysis: Separating surface
microtopography from industrument artifacts (Art.-No. 4100-20).
- In: GU, Z.-H., MARADUDIN, A. A. (Hrsg.): Proc. SPIE, Scattering
and Surface Roughness III, San Diego, Aug. 2000.
- (PETERSEN, R., ROTHE, H.) Development problems of a Nanometer
Coordinate Measuring Machine (NCMM) (Art-No. 4100-13). - In: GU,
Z.-H., MARADUDIN, A. A. (Hrsg.): Proc. SPIE, Scattering and Surface
Roughness III, San Diego, Aug. 2000.