Rothe, Hendrik

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- (ROTHE, H., HÜSER, D., PETERSEN, R.) Simulation of the dynamic behaviour of a Nanometer Coordinante Measuring Machine (PTB-Bericht No PTB-F-39). - In: HASCHE, K., MIRANDE, W., WILKENING, G. (Hrsg.): Proceedings of the 4th Seminar on Quantitative Microscopy: Dimensional measurements in the micro- and nanometre range - applications - challenges - state of the art, Semmering, Jan. 2000.
- (HÜSER, D., ROTHE, H., PETERSEN, R.) Recognizing Objects in Dimensional Micro-Metrology (PTB-Bericht No PTB-F-39). - In: HASCHE, K., MIRANDE, W., WILKENING, G. (Hrsg.): Proceedings of the 4th Seminar on Quantitative Microscopy: Dimensional measurements in the micro- and nanometre range - applications - challenges - state of the art, Semmering, Jan. 2000.
- (RINDER, T., ROTHE, H.) Angle resolved light scatter measurements for the surface parameter identification. - Proceedings of the X. International Colloquium on Surfaces, Chemnitz, Feb. 2000, S. 310-321. ISBN-No. 3-8265-6999-7.
- (RINDER, T., ROTHE, H.) Surface identification using angle resolved light scatter measurements. - IEEE-INNS-ENNS International Joint Conference on Neural Networks, Como, July 2000, Chapter 5.7: Manufacturing.
- (RINDER, T., ROTHE, H.) Design problems of calibrated BRDF sensors: dynamic range, speed, angle of view (Art.-No. 4100-18). - In: GU, Z.-H., MARADUDIN, A. A. (Hrsg.): Proc. SPIE, Scattering and Surface Roughness III, San Diego, Aug. 2000.
- (HÜSER, D., ROTHE, H.) AFM data analysis: Separating surface microtopography from industrument artifacts (Art.-No. 4100-20). - In: GU, Z.-H., MARADUDIN, A. A. (Hrsg.): Proc. SPIE, Scattering and Surface Roughness III, San Diego, Aug. 2000.
- (PETERSEN, R., ROTHE, H.) Development problems of a Nanometer Coordinate Measuring Machine (NCMM) (Art-No. 4100-13). - In: GU, Z.-H., MARADUDIN, A. A. (Hrsg.): Proc. SPIE, Scattering and Surface Roughness III, San Diego, Aug. 2000.