Rothe, Hendrik

A
- (SCHAEL, U., ROTHE, H.) Simulation of eye-save imaging laser radar for advanced range estimation and improved design process using VRML. - In: GU, Z., MARADUDUIN , A. (Hrsg.): Proceedings SPIE, Surface Scattering and Diffraction III, No. 5189-18. San Diego.
- (ROTHE, H., HAHLWEG, C.) Estimation of performance limits of multi-pole method using parallelcomputing techniques. - In: GU, Z., MARADUDUIN , A. (Hrsg.): Proceedings SPIE, Surface Scattering and Diffraction III, No. 5189-16. San Diego.
- (ROTHE, H., PETERSEN, R.) Developing review of an angle resolved light scatter sensor. - In: GU, Z., MARADUDUIN , A. (Hrsg.): Proceedings SPIE, Surface Scattering and Diffraction III, No. 5189-14. San Diego.
- (HAHLWEG, C., ROTHE, H.) Deducing light scatter from AFM-measurements. - In: GU, Z., MARADUDUIN , A. (Hrsg.): Proceedings SPIE, Surface Scattering and Diffraction III, No. 5189-12. San Diego.
- (RINDER, T., ROTHE, H.) Localization of sub-100-nm particles on wafers with solid state detector arrays. - In: DUPARRÉ, A., SINGH, B. (Hrsg.): Proceedings SPIE, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, No. 5188-35. San Diego.
- (PETERSEN, R., ROTHE, H.) One way to accomplish the advanced requests of nanometrology: The Nanometer Coordinate Measuring Machine (NCMM). - In: DUPARRÉ, A., SINGH, B. (Hrsg.): Proceedings SPIE, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, No. 5188-29. San Diego.
- (PETERSEN, R., ROTHE, H., STOVER, J.) The Nanometer Coordinate Measuring Machine (NCMM): AFM-scans in millimeter range without stitching procedures. - Proceedings of Seeing at the Nanoscale. Conference of California NanoSystems Institute (CNSI), Albany NanoTech, and Veeco Instruments. Santa Barbara.
- (SCHAEL, U., ROTHE, H.) Advanced simulation for eye-safe, imaging laser radar for range estimation, system comparison and design process. - In: OSTEN, W. (Hrsg.): Proc. SPIE, Optical Measurement Systems for Industrial Inspection III, No. 5144-33. München.
- (PETERSEN, R., ROTHE, H.) A milestone in nanometrology: Large area AFM-scans with the Nanometre Coordinate Measuring Machine (NCMM). - In: WECK, M., KUNZMANN, H. (Hrsg.): Proceedings of Euspen International Topical Conference on Precision Engineering, Micro Technology, Measurement Techniques and Equipment, Vol. 2. Aachen.